Low profile IC test clip

Details Low profile IC test clip Low profile IC test clip

1983-11-21

1985-04-02

McQuade, John

Geometrical instruments

339 17CF, 339 75MP, 339 91R, H01R 13639

Patent

active

045084033

ABSTRACT:
A novel low profile IC test clip for removable attachment to a DIP IC having substantially fixed contacts for sliding engagement with the IC pins, locking means at the ends, which are uncoupled to the contacts, and a laterally extending multi-conductor cable internally connected to the contacts.

REFERENCES:
patent: 3551878 (1970-12-01), Rossman
patent: 3701077 (1972-10-01), Kelly, Jr.
patent: 3725842 (1973-04-01), Feldberg
patent: 4113179 (1978-09-01), McKee
patent: 4257028 (1981-03-01), Narozny et al.

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