Measuring and testing – Volume or rate of flow – By measuring transit time of tracer or tag
Patent
1995-03-13
1997-07-22
Williams, Hezron E.
Measuring and testing
Volume or rate of flow
By measuring transit time of tracer or tag
7386118, 7386128, G01F 1712, G01F 166
Patent
active
056505710
ABSTRACT:
A low power apparatus for measuring various process parameters and/or physical properties of a fluid or gas medium by measuring the change of a wave signal or time dependent signal as it traverses the fluid or gas medium, the apparatus comprising: at least one transmission transducer for providing a transmitted wave or time dependent signal for injection into the fluid or gas medium; at least one reception transducer, displaced from the transmission transducer for receiving a received wave or time dependent signal from the fluid or gas medium; and an analog signal processor, coupled to the reception transducer, for processing of the received wave or time dependent signal such that a short interval of the processed received wave or time dependent signal is extracted.
REFERENCES:
patent: H609 (1989-03-01), Higgins et al.
patent: 3621221 (1971-11-01), Cann
patent: 3762221 (1973-10-01), Coulthard
patent: 3819919 (1974-06-01), McGinigle
patent: 3845660 (1974-11-01), McDonnell
patent: 3946342 (1976-03-01), Hartmann
patent: 4019038 (1977-04-01), Critten et al.
patent: 4035628 (1977-07-01), Lampe et al.
patent: 4079238 (1978-03-01), Lampe et al.
patent: 4201083 (1980-05-01), Kurita et al.
patent: 4223270 (1980-09-01), Schmid et al.
patent: 4232548 (1980-11-01), Baumoel
patent: 4248085 (1981-02-01), Coulthard
patent: 4257275 (1981-03-01), Kurita et al.
patent: 4267580 (1981-05-01), Bond et al.
patent: 4331025 (1982-05-01), Ord, Jr.
patent: 4397193 (1983-08-01), Ryan et al.
patent: 4402230 (1983-09-01), Raptis
patent: 4478088 (1984-10-01), Loveland
patent: 4480485 (1984-11-01), Bradshaw et al.
patent: 4494213 (1985-01-01), Thompson
patent: 4507974 (1985-04-01), Yelderman
patent: 4598593 (1986-07-01), Sheen
patent: 4604904 (1986-08-01), Massen
patent: 4708021 (1987-11-01), Braun et al.
patent: 4760743 (1988-08-01), Clifford et al.
patent: 4787252 (1988-11-01), Jacobson et al.
patent: 4841780 (1989-06-01), Inada et al.
patent: 4912519 (1990-03-01), Yoshida et al.
patent: 4930358 (1990-06-01), Motegi et al.
patent: 4976154 (1990-12-01), Schneider et al.
patent: 5012449 (1991-04-01), Todd
patent: 5029481 (1991-07-01), Keech
patent: 5060506 (1991-10-01), Douglas
patent: 5121639 (1992-06-01), McShane
patent: 5224482 (1993-07-01), Nikoonahad
patent: 5336957 (1994-08-01), Yamanouchi et al.
PCT International Search Report dated Oct. 25, 1996--International Application No. PCT/US96/03378 (7 pps.).
A.G. Milnes, Semiconductor Devices and Integrated Electronics, published by Van Nostrand Reinhold Company, pp. 590-598 and 610-617.
D.T. Bell, Jr., and L.T. Claiborne, "Phase Code Generators and Correlators", Texas Instruments, Inc., Dallas, Texas, pp. 307-316.
Demark Anthony M.
Freud Paul J.
Punis Giancarlo
Trainer Michael N.
Kwok Helen C.
Williams Hezron E.
LandOfFree
Low power signal processing and measurement apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Low power signal processing and measurement apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low power signal processing and measurement apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1561019