Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-01-29
2008-01-29
Auduong, Gene N. (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185220, C365S185290
Reexamination Certificate
active
07324387
ABSTRACT:
Low power high density random access memory flash cells and arrays using Fowler Nordheim (FN) tunneling for both programming and erasing. The memory array is divided into sectors, each sector comprising a predetermined number of rows. The bit lines are similarly segmented, each global bit line being selectively connectable to a local bit line for each sector, each local bit line being connected to the drains of all floating gate cells in a respective column of each sector. The sources of all floating gate cells in a respective column of each sector are connected to a local source line for that sector, the local source lines for each sector being controllably connectable to respective global source lines. Consequently all floating gate cells within a column of a sector are connected in parallel, source to source and drain to drain. Representative programming and erase voltages not disturbing other cells are disclosed.
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Bergemont Albert
Prabhakar Venkatraman
Sinai Keyhan
Auduong Gene N.
Blakely , Sokoloff, Taylor & Zafman LLP
Maxim Integrated Products Inc.
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