Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate
2011-06-21
2011-06-21
Mandala, Victor (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Heterojunction
C257S014000, C257S017000, C257SE29069, C257SE29246, C257SE29252, C257SE49002, C257SE49003
Reexamination Certificate
active
07964866
ABSTRACT:
Embodiments of the invention relate to apparatus, system and method for use of a memory cell having improved power consumption characteristics, using a low-bandgap material quantum well structure together with a floating body cell.
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S. Datta et al., “85nm Gate Length Enhancement and Depletion mode InSb Quantum Well Transistors for Ultra High Speed and Very Low Power Digital Logic Applications”, Electron Devices Meeting, 2005 IEDM Technical Digest, Dec. 5-7, 2005, pp. 763-766 (hereinafter, “Datta”).
S. Datta et al., Ultrahigh-Speed 0.5 V Supply Voltage In0.7GA0.3As Quantum Well Transistors on Silicon Substrate, 2007 IEEE Electron Device Letters, vol. 28, No. 8, Aug. 2007, pp. 685-687.
S. Datta et al., “85nm Gate Length Enhancement and Depletion Mode InSb Quantum Well Transistors for Ultra High Speed and Very Low Power Digital Logic Applications”, Components Research, Technology & Manufacturing Group, Intel Corporation, Hillsboro, OR, 4 pages.
Dewey Gilbert
Pillarisetty Ravi
Rakshit Titash
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Mandala Victor
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