Low pin testing system

Details Low pin testing system Low pin testing system

2006-04-18

2006-04-18

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S756010, C324S758010

Reexamination Certificate

active

07030636

ABSTRACT:
A low pin testing system for efficiently detecting unlocked terminals within an electrical connector. The low pin testing system includes a housing with a receiver opening for removably receiving an electrical connector to be tested, a plurality of probe passages within the housing, a plurality of testing probes slidably positioned within the housing in a biased manner each having an engaging end extending into said receiver opening and corresponding to a terminal within the electrical connector, a plurality of light emitters for illuminating light through corresponding light passages, and a plurality of light receivers at the opposite end of the light passages. The light passages extend substantially transverse through a row of the probe passages and the testing probes each include a cutout that allows the light to pass through the testing probes when the testing probes are moved from engagement with the terminals of an electrical connector.

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Electrical Continuity & Components Sample Images www.eccco.com Website Printout, date unknown, 2 Pages.

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