Low noise light source for forensic examination

Details Low noise light source for forensic examination Low noise light source for forensic examination

1993-06-14

1996-05-07

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

356334, 2504581, G01J 318, G01N 2164

Patent

active

055151620

ABSTRACT:
In accordance with the present invention, a low noise light source for illuminating a treated or untreated deposition of material for forensic examination is disclosed. A light having a wide range of wavelengths is generated. The light is directed toward a reflective diffraction grating. The relative position between an exit slit and the grating is repeatedly adjusted to result in passage through the exit slit of different desired bands of wavelengths of output light from portions of the light reflected by the grating. The output light is directed through a filter, toward the deposition to be examined. The filter has a pass characteristic which substantially passes the desired bands and blocks the light that has a wavelength in an expected range of fluorescence of the deposition.

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Myrick et al, Applied Optics, vol. 29, No. 9, 20 Mar. 1990, pp. 1333-1344.

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