Low loss integration of wafer probes with microwave tuners

Details Low loss integration of wafer probes with microwave tuners Low loss integration of wafer probes with microwave tuners

2006-02-14

2006-02-14

Jones, Stephen E. (Department: 2817)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With waveguide or long line

C324S149000, C324S758010, C333S033000, C333S260000

Reexamination Certificate

active

06998836

ABSTRACT:
This invention relates to the reduction of insertion losses and by consequence maximization of reflection factors for on-wafer load pull testing of high power or low noise transistor chips, using as much a direct integration as possible between the slotted airline of the tuners and low loss probes, said probes being either modified commercial probes or probes made as an extension of the tuner slotted airline itself.

REFERENCES:
patent: 5570068 (1996-10-01), Quan
patent: 6515465 (2003-02-01), Kiyokawa et al.

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