Low leakage diode switches for a tester circuit for integrated c

Details Low leakage diode switches for a tester circuit for integrated c Low leakage diode switches for a tester circuit for integrated c

1993-06-15

1996-08-06

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 1300

Patent

active

055437281

ABSTRACT:
Pin electronics for an IC tester are built as an integrated circuit for testing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. The tester uses diode switches instead of discrete relays to switch between measurement ranges. Leakage current, on the order of nanoamperes from a switch that is open or disabled, is dramatically reduced by reverse biasing the diodes in each diode switch about the switch's diode bridge output node by an equal amount so that the summed current at the output node is almost zero.

REFERENCES:
patent: 3585500 (1971-06-01), Grubel
patent: 5103169 (1992-04-01), Heaton et al.

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