Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-01-15
2008-01-15
Phung, Anh (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C257S315000, C365S185050
Reexamination Certificate
active
07319618
ABSTRACT:
A flash memory cell includes a silicon substrate having a main surface, a source region in a portion of the silicon substrate proximate the main surface and a drain region in a portion of the silicon substrate proximate the main surface. The drain region is spaced apart from the source region. The memory cell includes a first dielectric layer formed on the main surface, a floating gate disposed above the first dielectric layer, an inter-gate dielectric layer disposed above the floating gate, a control gate disposed above the inter-gate dielectric layer, a second dielectric layer and a low-k dielectric spacer layer disposed on the second dielectric layer. The first dielectric layer covers a portion of the main surface between the source and the drain. The second dielectric layer surrounds outer portions of the first dielectric layer, the control gate, the inter-gate dielectric layer and the floating gate.
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Wu Chu-Ching
Yih Cheng-Ming
Akin Gump Strauss Hauer & Feld & LLP
Macronic International Co., Ltd.
Nguyen Hien
Phung Anh
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