Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2005-01-11
2005-01-11
Young, Brian (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
Reexamination Certificate
active
06842136
ABSTRACT:
A low-jitter clock distribution circuit, used in an integrated circuit having multiple analog-to-digital converters (ADCs), includes a plurality of cascaded inverters, each inverter including an upper P-channel transistor connected to a lower N-channel transistor. The ratio Wp/Wn of the widths of the P-channel and N-channel transistors in each inverter is equal to substantially the square root of the ratio Un/Up of the majority carrier mobilities of the N-channel and P-channel transistors as determined by the semiconductor fabrication process.
REFERENCES:
patent: 6434707 (2002-08-01), Eklof
Rabaey, J. M., “Digital Integrated Circuits: A Design Perspective” Published by Prentice-Hall, Inc., Second Edition, Sep. 2000.
Agarwal Nitin
Rath Shakti Shankar
Brady W. James
Swayze, Jr. W. Daniel
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Young Brian
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