Patent
1975-05-22
1976-03-09
Larkins, William D.
357 59, H01L 2978, H01L 2904
Patent
active
039435458
ABSTRACT:
A charge-coupled device having a semiconductor substrate, a layer of insulation covering the substrate, and a plurality of spaced-apart electrodes formed from a doped, polycrystalline semiconductor material of a particular conductivity type includes regions of interelectrode material doped with an impurity of a conductivity type opposite to said particular conductivity type.
REFERENCES:
patent: 3728590 (1973-04-01), Kim et al.
patent: 3836409 (1974-09-01), Amelio et al.
Radio-Electronics, Aug. 1973, pp. 56-57.
Fairchild Camera and Instrument Corporation
Larkins William D.
MacPherson Alan H.
Munson Gene M.
Richbourg J. Ronald
LandOfFree
Low interelectrode leakage structure for charge-coupled devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Low interelectrode leakage structure for charge-coupled devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low interelectrode leakage structure for charge-coupled devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-837007