Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-18
2011-01-18
Vu, Bao Q (Department: 2838)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S701000, C324S764010, C324S763010
Reexamination Certificate
active
07872481
ABSTRACT:
A measurement system with selectable feedback paths includes a DUT interface including a first and a second DUT sensor, the first sensor being connected to a first feedback path for providing a measure of a first DUT characteristic, the second sensor being connected to a second feedback path for providing a measure of a second DUT characteristic, the sensors having a shared reference path and each feedback path including a set point adjustment; a differential amplifier system including differential inputs and differential outputs, the differential outputs being applied to the DUT interface; and a multi-pole switcher for connecting the differential inputs to either the first feedback path and the reference path or to the reference path and the second feedback path, respectfully. The first feedback path is selected to produce a desired first DUT characteristic or the second feedback path is selected to produce a second desired DUT characteristic.
REFERENCES:
patent: 5039934 (1991-08-01), Banaska
patent: 5652524 (1997-07-01), Jennion et al.
patent: 6268735 (2001-07-01), Craig et al.
patent: 7714603 (2010-05-01), Eldridge et al.
patent: 2006/0152236 (2006-07-01), Kim
Goeke Wayne C.
Rice Martin J.
Keithley Instruments Inc.
Pearne & Gordon LLP
Tran Nguyen
Vu Bao Q
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