Low frequency acoustic microscope

Details Low frequency acoustic microscope Low frequency acoustic microscope

1984-12-13

1986-11-04

Kreitman, Stephen A.

Measuring and testing

Vibration

By mechanical waves

G01N 2904

Patent

active

046204431

ABSTRACT:
A scanning acoustic microscope is disclosed for the detection and location of near surface flaws, inclusions or voids in a solid sample material. A focused beam of acoustic energy is directed at the sample with its focal plane at the subsurface flaw, inclusion or void location. The sample is scanned with the beam. Detected acoustic energy specularly reflected and mode converted at the surface of the sample and acoustic energy reflected by subsurface flaws, inclusions or voids at the focal plane are used for generating an interference signal which is processed and forms a signal indicative of the subsurface flaws, inclusions or voids.

REFERENCES:
patent: 4394824 (1983-07-01), Kanda et al.
patent: 4524621 (1985-06-01), Yamanaka
R. D. Weglein, "A Model for Predicting Acoustic Material Signatures" Appl. Phys. Lett. 34 (3), pp. 179-181, Feb. 1979.

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