Low dielectric constant insulation layer for integrated circuit

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating

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257637, 257641, 257644, 257650, H01L 2358, H01L 310352

Patent

active

055980260

ABSTRACT:
A low dielectric insulation layer for an integrated circuit structure material, and a method of making same, are disclosed. The low dielectric constant insulation layer comprises a porous insulation layer, preferably sandwiched between non-porous upper and lower insulation layers. The presence of some gases such as air or an inert gas, or a vacuum, in the porous insulation material reduces the overall dielectric constant of the insulation material, thereby effectively reducing the capacitance of the structure. The porous insulation layer is formed by a chemical vapor deposition of a mixture of the insulation material and a second extractable material; and then subsequently selectively removing the second extractable material, thereby leaving behind a porous matrix of the insulation material, comprising the low dielectric constant insulation layer.

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