Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate
2005-10-25
2005-10-25
Vu, Hung (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
With means to control surface effects
Insulating coating
C257S759000, C257S762000
Reexamination Certificate
active
06958525
ABSTRACT:
A low dielectric film forming material contains siloxane resin and polycarbosilane dissolved in solvent. By using this solution, a low dielectric film is formed which contains siloxane resin and polycarbosilane bonded to the siloxane resin. Material of a low dielectric film is provided which is suitable for inter-level insulating film material. A semiconductor device is also provided which has a low dielectric constant film and high reliability.
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Official Action (German Patent Office) and Translation dated Sep. 8, 2004.
Fukuyama Shun-ichi
Nakata Yoshihiro
Owada Tamotsu
Sugiura Iwao
Suzuki Katsumi
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