Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-05-09
2006-05-09
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S1540PB
Reexamination Certificate
active
07042241
ABSTRACT:
A probe card includes a plurality of probes, where each probe is supported by the probe card. A plurality of landings are on the top of the probe card. Each of the landings is electrically interconnected with a coaxial cable that is also associated with one of the probes. A plurality of trenches defined by the probe card substantially encircles respective landings.
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Cowan Clarence E.
Tervo Paul A.
Cascade Microtech, Inc.
Chernoff Vilhauer McClung & Stenzel LLP
Nguyen Vinh P.
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