Low-current pogo probe card

Details Low-current pogo probe card Low-current pogo probe card

2005-02-15

2005-02-15

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

06856153

ABSTRACT:
A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between two dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a central opening so that the probing needles or needles included therein terminate below the opening in a pattern suitable for probing a test subject workpiece. A plurality of pogo pin receiving pad sets, each including a guard pad, occupy the periphery of the board. Each guard pad is electrically connected to a trace from the layer of conductive traces. The pad sets may be connected to the probing devices by low noise cables or traces. Air trenches separate the pad sets for reducing cross talk and signal settling times.

REFERENCES:
patent: 3810017 (1974-05-01), Wiesler et al.
patent: 4899106 (1990-02-01), Ogura
patent: 4973903 (1990-11-01), Schemmel
patent: 4983907 (1991-01-01), Crowley
patent: 6034533 (2000-03-01), Tervo et al.

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