Low capacitance V groove MOS NOR gate and method of manufacture

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

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148175, 148187, 148 15, 357 23, 357 41, 357 55, 29571, H01L 734, H01L 736, H01L 754

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039752216

ABSTRACT:
An MOS transistor is provided having a surface diffused drain and a common substrate source. A heavily doped base layer and a lightly doped space charge region are provided between the drain and source regions. The gate is formed on the inclined surface of a V groove which penetrates into the transistor to the substrate exposing the base layer to the gate structure. The gate is formed in the V groove by a silicon oxide insulative layer and conductive layer. Appropriate leads contact the gate conductor and the drain.

REFERENCES:
patent: 3355598 (1967-11-01), Tuska
patent: 3412297 (1968-11-01), Amlinger
patent: 3414740 (1968-12-01), Dailey et al.
patent: 3518509 (1970-06-01), Cullis
patent: 3751722 (1973-08-01), Richman
patent: 3752711 (1973-08-01), Kooi
patent: 3761785 (1973-09-01), Pruniauy
patent: 3764396 (1973-10-01), Tarui et al.
patent: 3823352 (1974-07-01), Pruniauy et al.

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