Low capacitance probe tip

Details Low capacitance probe tip Low capacitance probe tip

1990-03-19

1991-05-14

Wieder, Kenneth

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, 439 80, G01R 3122, H01R 3900

Patent

active

050159470

ABSTRACT:
A low capacitance probe tip, having minimal metal content to reduce loading on a circuit under test, is formed from a small diameter wire. The small diameter wire had a straight section, a formed section and a pointed front end section. The major dimension of the formed section is slightly greater than the interior diameter of a small diameter hole in a probe body so that, when inserted into the small diameter hole, the formed section forms an interference fit with the hole to securely hold the probe tip in the probe body. The probe tip within the hole makes electrical contact with a hybrid electrical circuit board having an electrical contact at the small diameter hole. The formed section shrinks when pulled for either insertion or replacement, and expands to form the interference fit when the pulling tension is removed. Thus the probe tip is readily replaceable.

REFERENCES:
patent: 1508163 (1924-09-01), Clifton
patent: 2660438 (1953-11-01), Holtz, Jr.
patent: 2670962 (1954-03-01), Holtz, Jr.
patent: 3613001 (1971-10-01), Hostetter
patent: 3812311 (1974-05-01), Kvaternik
patent: 4773877 (1988-09-01), Kruger et al.

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