Low capacitance measurement probe

Details Low capacitance measurement probe Low capacitance measurement probe

2007-07-24

2007-07-24

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

C324S690000, C600S459000

Reexamination Certificate

active

11458486

ABSTRACT:
A low capacitance measurement probe having an outer conductor forming an outer wall; a non-conductive spacer forming a first wall between a conductive layer and the outer conductor; the conductive layer forming a second wall coupled to the interior of the first wall; an insulating layer forming a third wall coupled to the interior of the second wall; and an inner conductor forming an inner wall coupled to the interior of the third wall. The probe may include a knob or a button in the inner conductor at a tip of the probe to increase the surface area of the inner conductor in order to the sensitivity of the probe.

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