Low capacitance interconnection

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means

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257758, H01L 2900

Patent

active

059006684

ABSTRACT:
A semiconductor device having reduced parasitic capacitance and, consequentially increased integrated circuit speed, is achieved by removing sections of dielectric interlayers which do not support conductive patterns, as by anisotropic etching, to form air gaps which can remain or are filled in with a dielectric material having a low dielectric constant. In another embodiment, a conformal dielectric coating is deposited, having a low dielectric constant.

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patent: 5413962 (1995-05-01), Lur et al.
patent: 5598028 (1997-01-01), Losavio et al.
patent: 5612914 (1997-03-01), Liu et al.
patent: 5654570 (1997-08-01), Agnello
patent: 5708303 (1998-01-01), Jeng

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