Loop test system in an integrated circuit

Details Loop test system in an integrated circuit Loop test system in an integrated circuit

1991-03-19

1993-08-24

Olms, Douglas W.

Multiplex communications

Wide area network

Packet switching

379 5, 371 226, H04J 116

Patent

active

052395367

ABSTRACT:
In the transmission data test mode of the integrated circuit, the user sets test transmission data as transmission data and supplies a transmission data test command to a returning unit, whereby the test transmission data output from the transmission unit is returned by the returning unit and received by the reception unit. In that case, a format converting unit receives the test transmission data in the data format of the transmission data. Then, by comparing the test transmission data and data received by the reception unit, the user can carry out a transmission data test. In the reception data test mode of the integrated circuit, the user sets test reception data, designates a reception timing and supplies a reception data test command to a test reception data input unit, whereby the test reception data is received by the reception unit via the test reception data input unit. Then, by comparing the test reception data and data received by the reception unit and corresponding to the designated reception timing, the user can perform a reception data test.

REFERENCES:
patent: 4059729 (1977-11-01), Eddy et al.
patent: 4149038 (1979-04-01), Pitroda et al.
patent: 4815119 (1989-03-01), Mills
patent: 4845735 (1989-07-01), Payne et al.

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