Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1979-03-02
1981-10-20
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
33125C, 356375, G01B 1114
Patent
active
042957427
ABSTRACT:
A guiding apparatus for guiding and positioning a scanning unit in a longitudinal measuring device is disclosed wherein the measuring device includes a measuring scale, a driving unit for connecting the device to an object whose position is to be measured, and first and second guide surfaces for guiding the scanning unit along the scale. In the preferred embodiment the guiding apparatus comprises a flexible coupling rod or wire which connects the scanning unit to the driving unit in a flexible manner while maintaining a constant spacing therebetween and first and second springs which bias the scanning unit into contact with the first and second guide surfaces, respectively. Improved guiding and positioning are obtained by separating the coupling function from the guiding function and by using separate springs to bias the scanning unit against the two guide surfaces.
REFERENCES:
patent: 3816003 (1974-06-01), Litke
patent: 4037325 (1977-07-01), Weber et al.
patent: 4063086 (1977-12-01), Hirose
patent: 4070759 (1978-01-01), Nelle
patent: 4149319 (1979-04-01), Nelle
patent: 4152837 (1979-05-01), Nelle et al.
patent: 4169316 (1979-10-01), Ernst
Nelle Gunther
Swassek Gunter
Dr. Johannes Heidenhain GmbH
Punter William H.
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