Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1974-10-03
1976-03-23
Corbin, John K.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324 73PC, G01R 1512
Patent
active
039463109
ABSTRACT:
A device for testing the logic states of integrated circuits while operating in-circuit. The device includes a hand-held housing containing a pair of spaced circuit boards to which a clip is electrically coupled, the clip having terminals for making electrical contact with the pins on a test IC. The device has a circuit programmed for a particular IC by a socket having removable pins of different lengths. The socket has means for receiving a reference IC against which the test IC is to be compared. Switch means coupled with the circuit permit individual testing of the pins of the test IC.
REFERENCES:
patent: 3286175 (1966-11-01), Gerbier et al.
patent: 3667037 (1972-05-01), Kierce
patent: 3670245 (1972-06-01), Gordon
patent: 3699501 (1972-10-01), Enright et al.
patent: 3821645 (1974-06-01), Vinsani
"New Product Applications," IEEE Spectrum, Mar. 1971, p. 87.
Lam Tim Yee
Saper Barry M.
Corbin John K.
Fluke Trendar Corporation
Hille R.
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