Logic probe

Details Logic probe Logic probe

1983-06-30

1986-07-08

Krawczewicz, Stanley T.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Nonquantitative

G01R 1914

Patent

active

045995575

ABSTRACT:
A test probe for determining the logic state of a digital logic circuit, which probe utilizes threshold detectors to determine the relative voltage level of a test point, and gate circuits to enable various voltage conditions, e.g., a ground, high, low, uncommitted, or a supply voltage, or a random pulse or a pulse train, to be be monitored and the test result indicated on an LED alpha display device. The threshold detectors are selectively settable so that the probe is particularly adapted to test TTL and CMOS circuitry.

REFERENCES:
patent: 3525939 (1970-08-01), Cartmell
patent: 3944921 (1976-03-01), Tsuda et al.
patent: 4110687 (1978-08-01), Sneed, Jr.
patent: 4189673 (1980-02-01), Shintaku
patent: 4321543 (1982-03-01), Tuska
Hastings, Passive Logic Probe, Radio & Electronics Constructor, Jun. 1980, pp. 601-603.
Mercer, Logic Probe, Practical Electronics, Nov. 1980, p. 70.

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