Logic level test probe with grated oscillator

Details Logic level test probe with grated oscillator Logic level test probe with grated oscillator

1974-02-13

1976-03-16

Strecker, Gerard R.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Nonquantitative

324 725, G01R 3102, G01R 1916

Patent

active

039449211

ABSTRACT:
An electronic circuit test equipment generates signals indicative of electrical conditions of a desired point in a circuit under test. The signals may be audible. light signals or combination thereof.

REFERENCES:
patent: 2437876 (1948-03-01), Cohn
patent: 2457288 (1948-12-01), Usselman
patent: 3021514 (1962-02-01), Regis et al.
patent: 3207995 (1965-09-01), Beer et al.
patent: 3503062 (1970-03-01), Witzke et al.
patent: 3543154 (1970-11-01), Gordon
patent: 3619775 (1971-11-01), Naylor et al.
patent: 3628141 (1971-12-01), Union et al.
patent: 3742351 (1973-06-01), Palmer et al.
patent: 3750015 (1973-07-01), Sheker et al.
Gordon, Gary B. IC Logic Checkout Simplified, Hewlett Packard Journal, June, 1969 p. 14-16.

Affiliated with

Also associated with

Rating

Logic level test probe with grated oscillator does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Logic level test probe with grated oscillator, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Logic level test probe with grated oscillator will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-295349