Logic gate size optimization process for an integrated circuit w

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364488, 364490, G06F 1750

Patent

active

056194188

ABSTRACT:
An integrated circuit, when designed, must adhere to timing constraints while attempting to minimize circuit area. In order to adhere to timing specifications while arriving at a near-optimal circuit surface area, an iterative process is used which selectively increases logic gates sizes by accessing logic gates from a memory stored logic gate library. A circuit representation is read along with timing constraints for circuit paths. Each circuit path in the circuit is processed to find it's actual circuit path delay. A most out-of-specification circuit path (in terms of speed) is chosen in the circuit and a sensitivity calculation is performed for each logic gate in the most out-of-specification circuit path. The logic gate in the circuit path with the maximized sensitivity (sensitivity=.DELTA.speed/.DELTA.area) is increased in size by accessing a larger gate in the library in order to improve speed at the expense of area. The above process continues iteratively until no out-of-specification circuit paths are found.

REFERENCES:
patent: 4827427 (1989-05-01), Dunlop et al.
patent: 5003487 (1991-03-01), Drumm et al.
patent: 5031111 (1991-07-01), Chao et al.
patent: 5095441 (1992-03-01), Hopper et al.
patent: 5402356 (1995-03-01), Schaefer et al.
patent: 5406497 (1995-04-01), Altheimer et al.
patent: 5422317 (1995-06-01), Hua et al.
patent: 5426591 (1995-06-01), Ginetti et al.
patent: 5459673 (1995-10-01), Carmean et al.
patent: 5475607 (1995-12-01), Apte et al.
patent: 5500808 (1996-03-01), Wang
patent: 5510999 (1996-04-01), Lee et al.
patent: 5526277 (1996-06-01), Dangelo et al.
"Experiments Using Automatic Physical Design Techniques for Optimizing Circuit Performance," Dunlop et al; 1990 IEEE, pp. 216-220.
"Computing the Entire Active Area Versus Delay Trade-Off Curve for Gate Sizing with a Piecewise Linear Simulator," Buurman et al.
"Optimization-Based Transistor Sizing," Shyu et al; IEEE 1987 Custom Integrated Circuits Conference, pp 417-420.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Logic gate size optimization process for an integrated circuit w does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Logic gate size optimization process for an integrated circuit w, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Logic gate size optimization process for an integrated circuit w will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2401296

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.