Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1992-03-26
1993-08-31
Nguyen, Vinh
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 731, 371 223, G01R 3128
Patent
active
052412652
ABSTRACT:
A logic function circuit has M columns of N series-connected flip-flops, M logic circuits and M multiplexers. Each logic circuit and multiplexer are associated with a respective column. The multiplexers determine operation and test modes. In the operation mode, each logic circuit acts on data from the Nth row flip-flop and a multiplexed input signal, and its logic result data is latched into the first row flip-flop of the respective column. In the test mode, a scan data stream of M.times.N bits is transferred through the M.times.N flip-flops and stored therein. Thereafter, a test data bit, instead of the input data signal, is fed to the logic circuits. By verifying the logic result data based on the latched scan data and the test data, it can be determined whether the logic circuits and the flip-flops are functioning properly. Since only one multiplexer for mode selection and one logic circuit is required for each column of flip-flops, a greater number of flip-flops can be fabricated in a limited area on one chip.
REFERENCES:
patent: 4879718 (1989-11-01), Sanner
patent: 4972144 (1990-11-01), Lyon et al.
McDonnell Michael J.
Tombul Aris
Mowle John E.
Nguyen Vinh
Northern Telecom Limited
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