Logic circuit with self-test

Details Logic circuit with self-test Logic circuit with self-test

1984-10-18

1987-07-21

Atkinson, Charles E.

Excavating

324 73R, G01R 3128

Patent

active

046823310

ABSTRACT:
A logic circuit according to this invention has a logic section. First input terminals of first to third EX OR gates are respectively connected to output terminals of preselected logic elements among the logic elements which constitute the logic section. Output terminals of the first and second EX OR gates are connected to second input terminals of the second and third EX OR gates. The functional test for this logic circuit is performed by inputting test pattern signals to the logic section and by comparing output signals of the logic section and an output signal of the third EX OR gate with the expected values.

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patent: 4541090 (1985-09-01), Shiragasawa
LeBlanc, LOCST: A Built-In Self-Test Technique, IEEE Design & Test, Nov. 1984, pp. 45-52.
Sellers, Jr. et al., Error Detecting Logic for Digital Computers, McGraw-Hill Co., 1968, pp. 207-211.

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