Logic circuit having a test data loading function

Details Logic circuit having a test data loading function Logic circuit having a test data loading function

1986-04-29

1988-04-05

Heyman, John S.

Electrical pulse counters, pulse dividers, or shift registers: c

Systems

Identifying or correcting improper counter operation

377 73, 307465, 307291, 3072471, 365201, 365205, H03K 3037, H03K 19003, H03K 2140

Patent

active

047363959

ABSTRACT:
A logic circuit having a test data loading function, comprising at least one J-K flip-flop. Each J-K flip-flop includes a test data latching logic circuit. In response to an enable signal, test data is selected in place of the usual J and K input data to be latched. In a complex logic circuit including such flip-flops, a test can be effected in a short time.

REFERENCES:
patent: 3714472 (1973-01-01), Lagemann
patent: 3878405 (1975-04-01), Sylvan
patent: 4277699 (1981-07-01), Brown et al.
patent: 4396829 (1983-08-01), Sugihara
patent: 4627085 (1986-12-01), Yuen

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