Logic built in self-test diagnostic method

Details Logic built in self-test diagnostic method Logic built in self-test diagnostic method

1997-07-23

1999-07-27

Nguyen, Hoa T.

Excavating

371 224, G01R 3128, G06F 1100

Patent

active

059302704

ABSTRACT:
A system and method for diagnosing the faults of an electronic device by running a series of tests, identifying the tests where the electronic device failed, without having to check the results of each test, storing information generated during only the tests where the electronic device failed, and using the information to diagnose the faults in the electronic device. The test results are accumulated into a Multiple Input Shift Register (MISR) which need not be examined after each test to determine which tests the device failed. The problem of a failure during one test manifesting into the MISR during subsequent tests is handled by predicting the effect of the failure on the MISR during subsequent tests.

REFERENCES:
patent: 4763274 (1988-08-01), Junker et al.

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