Logic analyzer

Excavating

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371 27, 324 73R, G01R 3128, G06F 1100

Patent

active

047019182

ABSTRACT:
A logic analyzer applies test pattern signals from a pattern generator to a circuit under test and sequentially reads logic outputs into a memory. The output from the circuit under test when it reaches a predetermined logic state is input as an external control signal into the logic analyzer. A change command is generated from the pattern generator in relation to the generation of the test pattern signal. When the change command and the external control signal are obtained at the same time, and flow of the generation of the test pattern signals is changed to a predetermined flow.

REFERENCES:
patent: 3909792 (1975-09-01), Harris
patent: 4216374 (1980-08-01), Lam
patent: 4313200 (1982-01-01), Nishiura
patent: 4425643 (1984-01-01), Chapman
patent: 4434488 (1984-02-01), Palmquist
patent: 4450442 (1984-05-01), Tanaka
patent: 4450560 (1984-05-01), Conner
patent: 4467324 (1984-08-01), Bachman
patent: 4503536 (1985-03-01), Panzer
patent: 4584683 (1986-04-01), Shimizu
patent: 4601033 (1986-07-01), Whelan
M. Gatrell, "Automatically Generating Efficient Testing Sequences . . . ", IBM Tech. Bull., V19, No. 4, 9/1976, pp. 1448-1449.

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