Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-11-13
1998-04-14
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, 439912, G01R 3102
Patent
active
057396973
ABSTRACT:
A mechanism is provided as part of a test clip for locking the clip to the body of an integrated circuit device, at the corner regions of the IC body. The mechanism includes locking fingers (62, FIG. 4 ) that are formed of metal spring wire, with each finger having an upper part (84) fixed to a base (22) that closely engages an upper portion of the IC body, a middle part (84) that extends at a downward-axially outward incline, and a lower finger end (66) that engages a lower portion of the IC body. When a shaft (72) is pushed down against the biasing of a spring (74), the shaft moves down an actuator (64) that has prongs (80) which press against the middle parts of the locking fingers to deflect them radially inwardly, so the finger lower ends slide radially inwardly along grooves (112) formed in the base, to engage the lower portion of the IC body.
REFERENCES:
patent: 4671592 (1987-06-01), Ignasiak et al.
patent: 4750890 (1988-06-01), Dube et al.
patent: 4996476 (1991-02-01), Balyasny et al.
patent: 5180976 (1993-01-01), Van Loan et al.
patent: 5477161 (1995-12-01), Kardos et al.
patent: 5497104 (1996-03-01), Balyasny
Balyasny Marik
Hirvela George Ray
ITT Corporation
Karlsen Ernest F.
Phung Anh
LandOfFree
Locking mechanism for IC test clip does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Locking mechanism for IC test clip, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Locking mechanism for IC test clip will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-638794