Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1993-05-21
1994-11-15
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
G01N 2188
Patent
active
053653289
ABSTRACT:
A method for characterizing an event in acquired digital data is described where the event has a known shape and a pattern having amplitude and location coefficients is applied to the data for determining a best fit between the data and the pattern as a function of a peak RMS value. The derived RMS value is compared to a threshold value for verifying the existence of the event. The event is characterized as to amplitude and location using the amplitude and location coefficients of the pattern. Such a method is useful in characterizing non-reflective events in acquired optical time domain reflectometry data.
REFERENCES:
patent: 4898463 (1990-02-01), Sakamoto et al.
patent: 5069544 (1991-12-01), Buerli
patent: 5155439 (1992-10-01), Holmbo et al.
Bucher William K.
McGraw Vincent P.
Tektronix Inc.
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