Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate
2005-02-01
2005-02-01
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
C356S318000, C250S458100, C250S459100
Reexamination Certificate
active
06850323
ABSTRACT:
An atomic force microscope (AFM) tip is used to selectively produce surface enhanced Raman scattering (SERS) for localized Raman spectroscopy. Spectra of thin films, undetectable with a Raman microprobe spectrometer alone, are readily acquired in contact with a suitably gold-coated AFM tip. Similarly, an AFM tip is used to remove sample layers at the nanometer scale and subsequently serve as a SERS substrate for ultra-trace analysis. This demonstrates the interface of an AFM with a Raman spectrometer that provides increases sensitivity, selectivity and spatial resolution over a conventional Raman microprobe. An AFM guiding the SERS effect has the potential for targeted single molecule spectroscopy.
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Ayaras et al, Surface enhancement in near-filed Raman spectroscopy, Appl. Physics Letters, Jun. 2000, v. 76, pp 3911-3913.
California Institute of Technology
Dawes Daniel L.
Lauchman Layla G.
Myers Dawes Andras & Sherman LLP
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