Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Magnetic force microscopy or apparatus therefor – e.g. – mfm...
Reexamination Certificate
2006-05-23
2010-11-23
Berman, Jack I (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Magnetic force microscopy or apparatus therefor, e.g., mfm...
C850S046000, C850S047000
Reexamination Certificate
active
07841016
ABSTRACT:
The invention is directed to a spin-polarized electron injector using a semiconductor tip, in which tip the injected electrons are photocreated by a circularly polarized light excitation incident on the rear of the tip. This tip is supported by a transparent lever or cantilever and undergoes a surface treatment for the purpose of removing the surface oxide layer, to prevent said layer from reforming and to improve the proportion of injected electrons.
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Bansropun Shailendra
Gerard Bruno
Lampel Georges
Paget Daniel
Peretti Jacques
Berman Jack I
Chang Hanway
Ecole Polytechnique
Lowe Hauptman & Ham & Berner, LLP
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