Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2007-10-30
2007-10-30
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C073S865800, C073S866000, C324S200000, C324S222000, C324S228000, C324S234000, C324S238000, C702S035000, C702S036000
Reexamination Certificate
active
11249047
ABSTRACT:
Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
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Goldfine Neil J.
Schlicker Darrell E.
Sheiretov Yanko K.
Washabaugh Andrew P.
Windoloski Mark D.
Cosimano Edward R
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JENTEK Sensors, Inc.
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