Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-10-29
1999-08-31
Karlsen, Ernest
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, 324754, G01R 3102
Patent
active
059458364
ABSTRACT:
A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited-access, no-clean test targets. The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates, personality pins and an alignment plate in order to couple test targets with multiplexed tester resources. The guided-probe test fixture of the present invention may also utilize a universal interface plate with double-headed spring probes and/or a wireless interface printed circuit board to facilitate the electrical coupling of test targets to tester resources. Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board containing both standard-access and limited-access, no-clean test targets. The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets, while at the same time capable of probing standard-access test targets.
REFERENCES:
patent: 4230985 (1980-10-01), Matrone et al.
patent: 4321533 (1982-03-01), Matrone
patent: 4771234 (1988-09-01), Cook et al.
patent: 4774459 (1988-09-01), Maelzer et al.
patent: 4774462 (1988-09-01), Black
patent: 4799007 (1989-01-01), Cook et al.
patent: 4818933 (1989-04-01), Kerschner et al.
patent: 4884024 (1989-11-01), DiPerna
patent: 4935696 (1990-06-01), DiPerna
patent: 4977370 (1990-12-01), Andrews
patent: 5450017 (1995-09-01), Swart
patent: 5485096 (1996-01-01), Aksu
patent: 5493230 (1996-02-01), Swart et al.
patent: 5506510 (1996-04-01), Blumenau
patent: 5510722 (1996-04-01), Seavey
patent: 5773988 (1998-06-01), Sayre et al.
QA Technology Company, Inc., Marketing brochure, copyright 1994.
Reducing Fixture-Induced Test Failures--Application Note 340-1, Hewlett-Packard Company dated Dec. 1990.
HP 3070 Family Test Fixture Product Catalog--Hewlett-Packard Company, copyright 1994.
Kanack Kris J.
Sayre Tracy L.
Slutz Robert A.
Deal Cynthia S.
Hewlett--Packard Company
Karlsen Ernest
Kobert Russell M.
LandOfFree
Loaded-board, guided-probe test fixture does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Loaded-board, guided-probe test fixture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Loaded-board, guided-probe test fixture will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2427279