Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-01-30
2007-01-30
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S058000, C702S188000, C324S424000, C324S114000, C340S638000
Reexamination Certificate
active
11062823
ABSTRACT:
This invention is intended to reduce the cost by displaying the load information of a plurality of circuits with a single display device and transferring one of the two communication units in the measuring instruments from the measuring instruments to the display device to acquire the load information of a plurality of circuits. The display device and the measuring instruments are separated from each other, and the display device includes a plurality of communications units connectable with a plurality of devices, while each of many measuring instruments includes a single communication unit.
REFERENCES:
patent: 5553094 (1996-09-01), Johnson et al.
patent: 2001/0000355 (2001-04-01), Santos et al.
patent: 2003/0009301 (2003-01-01), Anand et al.
patent: 2003/0165142 (2003-09-01), Mills et al.
patent: 2002-095152 (2002-03-01), None
Aihara Kazuya
Hayakawa Hideki
Kato Kazuhiko
Kimura Toshiko
Watanabe Tetsunori
Antonelli, Terry Stout and Kraus, LLP.
Barbee Manuel L
Hitachi Industrial Equipment Systems Co. Ltd.
Tsai Carol S. W.
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