Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1995-11-20
1997-02-04
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324537, 324705, 324713, 324718, 361 86, G01R 2708, G01R 3100
Patent
active
056002556
ABSTRACT:
A method and apparatus for measuring the electrical resistance of a circuit energized with AC power. The invention imposes a known DC current in the circuit under test and senses a resulting DC voltage drop that corresponds to the resistance of the circuit. The invention senses AC overvoltage conditions in the circuit under test and electrically isolates the measuring circuit from the circuit under test.
REFERENCES:
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patent: 4963830 (1990-10-01), Roth et al.
patent: 5006809 (1991-04-01), Mang et al.
patent: 5057772 (1991-10-01), Bruno et al.
patent: 5424894 (1995-06-01), Briscall et al.
patent: 5495178 (1996-02-01), Cheng
Moore John H.
Revak Christopher J.
Brown Glenn W.
Electro-Test, Inc.
Wieder Kenneth A.
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