Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2005-05-24
2005-05-24
Niebling, John F. (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
C438S015000
Reexamination Certificate
active
06897076
ABSTRACT:
A lithography system includes a pre-process apparatus which performs a pre-process for a substrate and an exposure apparatus which exposes the substrate pre-processed by the pre-process apparatus to a pattern. The pre-process apparatus includes a first control unit which transmits an instruction for starting exposure preparation to the exposure apparatus, and the exposure apparatus includes a second control unit which causes exposure preparation to start in accordance with the instruction transmitted from the pre-process apparatus.
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Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Luk Olivia T.
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