Lithography system, exposure apparatus and their control...

Semiconductor device manufacturing: process – With measuring or testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S015000

Reexamination Certificate

active

06897076

ABSTRACT:
A lithography system includes a pre-process apparatus which performs a pre-process for a substrate and an exposure apparatus which exposes the substrate pre-processed by the pre-process apparatus to a pattern. The pre-process apparatus includes a first control unit which transmits an instruction for starting exposure preparation to the exposure apparatus, and the exposure apparatus includes a second control unit which causes exposure preparation to start in accordance with the instruction transmitted from the pre-process apparatus.

REFERENCES:
patent: 5930138 (1999-07-01), Lin et al.
patent: 6320195 (2001-11-01), Magome
patent: 6406820 (2002-06-01), Ota
patent: 6597002 (2003-07-01), Kondo
patent: 6641981 (2003-11-01), Kaneko et al.
patent: 6654095 (2003-11-01), Nishi
patent: 6673638 (2004-01-01), Bendik et al.
patent: 6698944 (2004-03-01), Fujita
patent: 6699630 (2004-03-01), Ota
patent: 6709878 (2004-03-01), Akram et al.
patent: 6727981 (2004-04-01), Taniuchi et al.
patent: 2877998 (1999-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Lithography system, exposure apparatus and their control... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Lithography system, exposure apparatus and their control..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Lithography system, exposure apparatus and their control... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3378488

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.