Lithographic processing cell and device manufacturing method

Photocopying – Projection printing and copying cameras – Step and repeat

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S689000, C438S708000, C438S699000

Reexamination Certificate

active

07616291

ABSTRACT:
A double processing technique for device manufacture includes performing a first patterning step to form apertures in a resist layer which apertures are filled before the first resist layer is stripped and replaced by a second resist layer to be used in the second exposure.

REFERENCES:
patent: 6548347 (2003-04-01), Juengling
patent: 6720256 (2004-04-01), Wu et al.
patent: 6867116 (2005-03-01), Chung
patent: 6974549 (2005-12-01), Ohgaki
patent: 2003/0006410 (2003-01-01), Doyle
patent: 2005/0137734 (2005-06-01), Nieuwelaar et al.
patent: 2007/0229828 (2007-10-01), Kruiswijk
patent: 2004-281835 (2004-10-01), None
A machine translation of JP-2004 281835 A.
Non-Final Rejection mailed Sep. 4, 2008 for U.S. Appl. No. 11/396,915, filed Apr. 4, 2006, 10 pgs.
Final Rejection mailed Feb. 3, 2009 for U.S. Appl. No. 11/396,915, filed Apr. 4, 2006, 8 pgs (Final amended to Non-Final).
Second Non-Final Rejection mailed Mar. 25, 2009 for U.S. Appl. No. 11/396,915, filed Apr. 4, 2006, 9 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Lithographic processing cell and device manufacturing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Lithographic processing cell and device manufacturing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Lithographic processing cell and device manufacturing method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4096828

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.