Lithographic mask structure and method of producing the same com

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378 35, G03F 900

Patent

active

057336881

ABSTRACT:
A mask suitably usable in X-ray lithography has a membrane and a radiation absorbing material pattern formed on the membrane, wherein the radiation absorbing material pattern contains an alloy including tungsten (W) and molybdenum (Mo), the proportion of the molybdenum content to the alloy being in a range of 0.1-50 wt %, the alloy having crystal precedence orientation of {110}. In one preferred form, the absorbing material pattern is provided on an amolphous metal layer formed on the mask membrane.

REFERENCES:
patent: 4738907 (1988-04-01), Shigetomi et al.
patent: 5188706 (1993-02-01), Hori et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Lithographic mask structure and method of producing the same com does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Lithographic mask structure and method of producing the same com, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Lithographic mask structure and method of producing the same com will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-50335

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.