Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-07-17
2007-07-17
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
11053936
ABSTRACT:
A liquid crystal substrate inspection apparatus includes an inspection device for inspecting a liquid crystal substrate and a prober replacing device disposed adjacent to the inspection device. The prober replacing device has a conveying device for conveying a prober for inspecting a liquid crystal substrate. The inspection device and the prober replacing device are arranged next to each other, so that it is possible to shorten an inspection time of the liquid crystal substrate. The prober replacing device has the conveying device for automatically conveying the prober to the inspection device.
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Shinohara Makoto
Tanaka Gaku
Teramoto Akira
Hollington Jermele
Kanesaka Manabu
Shimadzu Corporation
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