Liquid crystal substrate inspection apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Reexamination Certificate

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11053936

ABSTRACT:
A liquid crystal substrate inspection apparatus includes an inspection device for inspecting a liquid crystal substrate and a prober replacing device disposed adjacent to the inspection device. The prober replacing device has a conveying device for conveying a prober for inspecting a liquid crystal substrate. The inspection device and the prober replacing device are arranged next to each other, so that it is possible to shorten an inspection time of the liquid crystal substrate. The prober replacing device has the conveying device for automatically conveying the prober to the inspection device.

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patent: 6396299 (2002-05-01), Hayashida
patent: 6759867 (2004-07-01), Sohn
patent: 6765203 (2004-07-01), Abel
patent: 6879180 (2005-04-01), Iwata et al.

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