Image analysis – Histogram processing – For setting a threshold
Patent
1992-01-15
1995-02-28
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 21, 382 48, G06K 900, G06K 948, G06K 920
Patent
active
053944810
ABSTRACT:
A method of inspecting a liquid crystal panel and determining the type of defect. Each part of the liquid crystal panel is extracted and inspected by comparison with an extracted reference part. The parts to be inspected may be found based on the location of previously found parts or by examining a plot of the density in the image. Vector data from a part that is known to be defectless is used to extract the reference part. Alternatively, the contour of a reference part may be determined by analyzing the vector data which was obtained for the parts to be inspected. The type of defect is determined by classifying the defective part according to characteristics of the part's image (e.g., brightness of the pixels) as compared with parts having known defects.
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Hiiro Kaoru
Kumagai Ryohei
Oosaka Manabu
Shimizu Harumi
Takahashi Tooru
Boudreau Leo H.
Cammarata Michael
Ezel Inc
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