Liquid crystal display with thin film transistor array free...

Liquid crystal cells – elements and systems – Particular excitation of liquid crystal – Electrical excitation of liquid crystal

Reexamination Certificate

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C349S043000, C349S145000, C349S146000

Reexamination Certificate

active

06781644

ABSTRACT:

FIELD OF THE INVENTION
This invention relates to a liquid crystal display and, more particularly, to a thin film transistor array incorporated therein and a process of fabrication.
DESCRIPTION OF THF RELATED ART
A typical example of the thin film transistor array is incorporated in a liquid crystal display. The thin film transistors of the array are associated with pixel electrodes, and selectively turns on and off so as to electrically connect the data lines to the associated pixels. The thin film transistor and the associated pixel electrode form in combination a pixel.
In this application, the drain pattern and the pixel electrodes are formed on a gate insulating layer shared between the thin film transistors of the pixels. The pixels are arranged in rows, and the pixel electrodes in each row are arranged at predetermined pitches. The pixel electrodes in a row are offset from the pixel electrodes in the next row by a half of the pitch. The pixels are laid on what people call “delta pattern”. The array of thin film transistors laid on the delta pattern has a drain pattern, a gate pattern and a storage pattern. These patterns are in proximity to one another, and are liable to be short circuited and/or capacitively coupled to each other. Especially, when the array of thin film transistors includes the pattern formed of amorphous silicon, residual amorphous silicon is liable to be left after the patterning step. The residual amorphous silicon is causative of the short-circuit between the drain pattern and the pixel electrode and/or between the adjacent pixel electrodes. If the residual amorphous silicon is left in the gap between the delta drain pattern and the source pattern parallel to each other, the short-circuit similarly takes place therebetween. The short-circuit results in a point defect.
If the patterns such as the drain lines and the pixel electrodes are spaced from each other, the wide gap prevents the patterns from the short-circuit. However, such a wide gap forces the designer to make the pixel electrodes narrower, and, accordingly, the aperture ratio is decreased. Moreover, the small aperture ratio results in a low transmittance of the screen. Thus, the wide gap is not a good solution against the short-circuit due to the residual amorphous silicon and residual metal.
Another prior art liquid crystal display is disclosed in Japanese Patent Publication of Unexamined Application (laid-open) No. 7-199223. The prior art liquid crystal display disclosed in the Japanese Patent Publication of Unexamined Application is hereinbelow referred to as “first prior art liquid crystal display”.
FIG. 1
shows the layout of one example of the first prior art liquid crystal display.
FIG. 2
shows the cross section taken along line F-F′,
FIG. 3
shows the cross section taken along line G-G′, and
FIG. 4
shows the delta pattern of thin film transistor array enclosed by broken lines H.
On a glass substrate
1
is patterned a gate layer
2
, which is covered with a gate insulating layer
3
of SiN
x
/SiO
x
. An intrinsic amorphous silicon layer
4
and a heavily-doped n-type amorphous silicon layer
5
are formed on the gate insulating layer
3
, and a contact slit
6
is formed in such a manner as to reach the glass substrate
1
. A source pattern
7
and a drain pattern
8
are defined, and the source pattern
7
is partially overlapped with a transparent pixel electrode
9
. The source pattern
7
, the drain pattern
8
, the transparent pixel electrode
9
and the exposed surface of the intrinsic amorphous silicon layer
4
are covered with a protective dielectric layer
10
.
There remains neither residual amorphous silicon nor residual alloy in the pattern shown in FIG.
4
. However, a piece of residual amorphous silicon
14
and a piece of residual alloy
15
may be left on the pattern in the fabrication process as shown in FIG.
5
. The piece of residual amorphous silicon
14
and the piece of alloy
15
are causative of short-circuits. The Japanese Patent Publication of Unexamined Application teaches that the gate insulating layer
3
between the area assigned to the drain pattern
8
and the area assigned to the transparent pixel electrodes
9
is selectively etched away so as to form the contact slit
6
.
FIG. 6
shows the layout of another example of the first liquid crystal display.
FIG. 7
shows the cross section taken along line I-I′,
FIG. 8
shows another cross section taken along line J-J′, and
FIG. 9
shows the delta pattern of thin film transistor array enclosed in broken line K. The layers and patterns of the other example are labeled with the same references designating corresponding layers and patterns incorporated in the example of the first prior art liquid crystal display.
There is neither residual amorphous silicon nor residual alloy on the delta pattern shown in FIG.
9
. However, a piece of amorphous silicon
14
and a piece of alloy
15
may be left on the delta pattern in the fabrication process as shown in FIG.
10
. Even if the piece of residual amorphous silicon
14
and the piece of residual alloy
15
are left on the area between the drain pattern
8
and the transparent pixel electrodes
9
and/or the area between the adjacent transparent pixel electrodes
9
, the piece of residual amorphous silicon
14
and the piece of residual alloy
15
are removed during the etching step, and the other example is prevented from the short-circuit due to the piece of residual amorphous silicon
14
and the piece of residual alloy
15
.
Yet another prior art liquid crystal display is disclosed in Japanese Patent Application No. 8-525570. The prior art liquid crystal display disclosed therein is hereinbelow referred to as “second prior art liquid crystal display”.
FIG. 11
shows the layout of the second prior art.
FIG. 12
shows a cross section taken along line L—L of
FIG. 11
,
FIG. 13
shows another cross section taken along line M—M of
FIG. 11
, and
FIG. 14
shows the delta pattern of thin film transistor array enclosed in broken line N. The layers and patterns of the second prior art liquid crystal display are labeled with the same references designating corresponding layers and patterns of the example of the first prior art liquid crystal display. A storage pattern
12
is further incorporated in the second prior art liquid crystal display, and a slit
16
is formed in the protective dielectric layer
10
. A piece of residual amorphous silicon
14
and a piece of residual transparent alloy may be left on the delta pattern as shown in FIG.
15
.
The fabrication process for the second prior art liquid crystal display includes the step of forming the slit
16
. Even if the piece of residual amorphous silicon
14
and the piece of residual alloy
15
are left on the area between the drain pattern
8
and the transparent pixel electrode
9
and/or the area between the adjacent transparent pixel electrodes
9
, the piece of residual amorphous silicon
14
and the piece of residual alloy are etched away in the patterning step. Thus, the second prior art liquid crystal display is prevented from the short-circuit due to the piece of residual amorphous silicon
14
and/or the piece of residual alloy
15
.
Following problems are encountered in the above-described prior art liquid crystal displays. The contact slit
6
is a particular feature of the delta pattern of the example of the first prior art liquid crystal display, and is formed around the pixel electrodes
9
. The contact slit
6
extends between the drain pattern
8
and the pixel electrode
9
, and is effective against the short-circuit therebetween due to the piece of amorphous silicon as shown in FIG.
5
. However, the contact slit
6
can not prevent the drain pattern
8
and the source pattern
7
from the short-circuit. This is because of the fact that the source pattern
7
extends in parallel to the drain pattern
8
without any contact slit
6
therebetween. As to the thin film transistors arranged in the delta pattern shown in
FIG. 10
, the storage pattern
12
is in p

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