Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-09-03
2009-08-18
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07576556
ABSTRACT:
An LCD device having test architecture includes a plurality of data lines, a plurality of gate lines, a plurality of common lines, and a plurality of rows of pixel units. The odd and even common lines are utilized for furnishing a first common voltage and a second common voltage, respectively. The odd and even rows of pixel units are coupled to corresponding odd and even common lines, respectively. Furthermore, disclosed is a test method for detecting defects of the LCD device. The test method includes enabling all the gate lines and furnishing a first test voltage to a corresponding data line during a first interval, disabling even gate lines and furnishing a second test voltage to the corresponding data line during a second interval, and switching the second common voltage from a first common test voltage to a second common test voltage during a third interval.
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patent: 6566902 (2003-05-01), Kwon et al.
patent: 6999153 (2006-02-01), Choi
patent: 7129923 (2006-10-01), Lu
patent: 2006/0208985 (2006-09-01), Hwang
Huang Wei-Kai
Lee Chin-Lun
Lin Chia-Chiang
AU Optronics Corp.
Hsu Winston
Nguyen Ha Tran T
Nguyen Trung Q
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