Liquid crystal cells – elements and systems – Nominal manufacturing methods or post manufacturing... – Defect correction or compensation
Reexamination Certificate
2005-12-20
2005-12-20
Flynn, Nathan J. (Department: 2826)
Liquid crystal cells, elements and systems
Nominal manufacturing methods or post manufacturing...
Defect correction or compensation
C349S042000, C349S054000
Reexamination Certificate
active
06977711
ABSTRACT:
An LCD having a plurality of test pads applied with a common voltage, covered with respective shielding conductor or located sufficiently far from pixels. A gate wire including pluralities of gate lines and test pads disconnected from the gate lines and located near one ends of the gate lines, and a common electrode wire including a plurality of common electrodes and a common electrode pad connected to the common electrode electrodes are formed on a substrate, and covered with a gate insulating film. A data wire and a pixel electrode wire are formed thereon and covered with a passivation film. The passivation film and the gate insulating film have contact holes exposing the test pads and the common electrode pad. A plurality of connecting members which are connected to the test pads and the common electrode pad through the contact holes are formed on the passivation film. Alternatively, the passivation film and the gate insulating layer have contact holes exposing only the common electrode pad, and a plurality of shielding members are provided on the passivation layer to be connected to the common electrode pad and to cover the test pads. Alternatively, the distance between the gate lines and the test pads is equal to or larger than twice the width of the pixel.
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Choi Kwon-Young
Kwak Sang-Ki
Park Myung-Jae
Park Woon-Yong
Tak Young-Jae
Flynn Nathan J.
McGuireWoods LLP
Sefer Ahmed N.
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