Liquid-assisted cryogenic cleaning

Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C134S033000, C134S036000, C134S007000, C134S001300

Reexamination Certificate

active

07056391

ABSTRACT:
The present invention is directed to the use of a high vapor pressure liquid prior to or simultaneous with cryogenic cleaning to remove contaminants from the surface of substrates requiring precision cleaning such as semiconductors, metal films, or dielectric films. A liquid suitable for use in the present invention preferably has a vapor pressure above 5 kPa and a freezing point below −50° C.

REFERENCES:
patent: 4264641 (1981-04-01), Mahoney et al.
patent: 5315793 (1994-05-01), Peterson et al.
patent: 5316560 (1994-05-01), Krone-Schmidt et al.
patent: 5354384 (1994-10-01), Sneed et al.
patent: 5377705 (1995-01-01), Smith, Jr. et al.
patent: 5409418 (1995-04-01), Krone-Schmidt
patent: 5561527 (1996-10-01), Krone-Schmidt
patent: 5611491 (1997-03-01), Bowers
patent: 5637027 (1997-06-01), Palumbo et al.
patent: 5766061 (1998-06-01), Bowers
patent: 5766368 (1998-06-01), Bowers
patent: 5775127 (1998-07-01), Zito
patent: 5796111 (1998-08-01), Mahoney
patent: 5804826 (1998-09-01), Borden et al.
patent: 5806544 (1998-09-01), Kosic
patent: 5836809 (1998-11-01), Kosic
patent: 5837064 (1998-11-01), Bowers
patent: 5853962 (1998-12-01), Bowers
patent: 5908510 (1999-06-01), McCullough et al.
patent: 5931721 (1999-08-01), Rose et al.
patent: 5961732 (1999-10-01), Patrin et al.
patent: 5967156 (1999-10-01), Rose et al.
patent: 5989355 (1999-11-01), Brandt et al.
patent: 6004400 (1999-12-01), Bishop et al.
patent: 6033484 (2000-03-01), Mohoney
patent: 6036581 (2000-03-01), Aoki
patent: 6066032 (2000-05-01), Borden et al.
patent: 6099396 (2000-08-01), Krone-Schmidt
patent: 6129091 (2000-10-01), Lee et al.
patent: 6146466 (2000-11-01), Bowers
patent: 6173916 (2001-01-01), Krone-Schmidt
patent: 6203406 (2001-03-01), Rose et al.
patent: 6306564 (2001-10-01), Mullee
patent: 6332470 (2001-12-01), Fishkin et al.
patent: 6500758 (2002-12-01), Bowers
patent: 6565920 (2003-05-01), Endisch
patent: 2003/0188763 (2003-10-01), Banerjee et al.
patent: 2004/0018803 (2004-01-01), Boumerzoug et al.
patent: 2004/0029494 (2004-02-01), Banerjee et al.
Jointly written by: European Elect. Component Manufactures Assc., Japan Elect. & Information Tech. Industries Assc., Korea Semiconductor Industry Assc., Taiwan Semiconductor Industry Assc., Semiconductor Industry Assc. International Technology Roadmap for Semiconductors 2001 EditionExecutive Summary—pp. 12-16.
Edited by Werner Kern, Noyes Publications, 1993. “Handbook of Semiconductor Wafer Cleaning Technology Science, Technology, and Applications”—pp. 152, 181, 182.
Edited by R.P. Donovan, Marcel Dekker Inc. “Particle Control for Semiconductor Manufacturing”—pp. 359, 361-364.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Liquid-assisted cryogenic cleaning does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Liquid-assisted cryogenic cleaning, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Liquid-assisted cryogenic cleaning will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3707406

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.