Linear near field test facility and process

Communications: directive radio wave systems and devices (e.g. – Testing or calibrating of radar system

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01S 740

Patent

active

054851580

ABSTRACT:
A method to measure the far field antenna pattern of an experimental antenna on a smaller range than conventionally used. The basic innovation of the present invention is that the implementation is moved in straight line, toward or away from the antenna under test (AUT), and the measurements are taken while the AUT is rotated about its phase center in a manner that is synchronized with the radial probe.

REFERENCES:
patent: 3158861 (1964-11-01), Iribe
patent: 4453164 (1984-06-01), Patton
patent: 4553145 (1985-11-01), Evans
patent: 4661820 (1987-04-01), Pouit et al.
patent: 4740790 (1988-04-01), Hess, Jr. et al.
patent: 4800387 (1989-01-01), Joy

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Linear near field test facility and process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Linear near field test facility and process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Linear near field test facility and process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-312476

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.